Comparison of detection results of electron microscopy technology and dynamic light scattering detection results

Electron microscopy and dynamic light scattering are common analytical techniques often used in scientific research to characterize nanomaterials. By comparing their technical characteristics we can draw the following conclusions:

1. For monodispersed samples, the electron microscope results are basically consistent with dynamic tube scattering. For example, the TEM nominal value in the 60-nanometer standard example manual is 60nm±5nm. The slight difference is due to the double electric layer of the particles in the suspension. and hydration layer.

2. For samples with wide distribution, the results of dynamic light scattering are usually larger than those of electron microscopy, because dynamic light scattering obtains light intensity distribution, while electron microscopy obtains quantity distribution. And the wider the distribution of samples, the greater this difference. Both results are correct for high-quality electron microscopy testing and dynamic light scattering.